Rutgers Institute for Advanced Materials, Devices and Nanotechnology (IAMDN) Scanning Transmission Electron Microscope (STEM) with meV resolution Electron Energy Loss Spectroscopy (EELS) can visualize the atomic structure of new materials, and explore composition, bonding, electronic and vibrational energy scales to enable better materials designs for efficient energy production and storage, catalysis, nanoelectronics and photonics.
Contact: Professor Philip Batson
The Rutgers Institute for Advanced Materials, Devices and Nanotechnology (IAMDN) Helium Ion Microscope is a novel instrument for imaging surfaces with sub-nm resolution and unprecedented depth of view. Non-conducting samples can be probed without metallic coatings, and samples can be modified and new structures can be formed by ion irradiation. Potential applications include advances in fields from drug delivery and the creation of orifices to explore DNA sequencing to the formation of quantum structures for advancing computing and communications.
Contact: Professor Torgny Gustafsson