The departmental x-ray diffraction facility is dedicated to the collection and analysis of high-quality x-ray diffraction data of materials of interest to the faculty and their collaborators. The physical forms of these materials include single- or poly- crystalline (powder) solids, liquid crystals, polymers (and bio-polymers), deposits on films and crystalline surfaces (Si), mixtures and composites. Analyses include molecular structure determination (single-crystal and powder/Rietveld), phase identification, strain or texture analysis (use of pole figures) and back-reflection Laue photography (substrate alignment). The users of the x-ray facility (including trained students and technicians) are in complete compliance with radiation safety (NJ and Rutgers) and all applicable NJ state laws.
|Bruker/Siemens HiStar multi-wire area detector and rotating anode x-ray generator|
|Bruker-AXS Smart APEX CCD diffractometer|
|Philips XPert powder diffractometer with sample changer|