Dept Banner
Dept Banner
hybrid perovskite single crystals
rubrene OFETs
Professor Shahab Shojaei-Zadeh publishes in Phys Rev Fluids
Fabris Group Research

Atomic-Resolution Chemical Analysis in Aberration-Corrected Analytical Electron Microscopy

Categories: Laboratory for Surface Modification (LSM)
Speaker: Masashi Watanabe, Lehigh U.
Date & Time: April 21, 2011 - 12:00pm
Location: Chem. 260

Chemical analysis at atomic-level spatial resolution with single-atom detection sensitivity is one of the ultimate goals in materials characterization. Such atomic-level materials characterization would be feasible by electron energy-loss spectrometry (EELS) and X-ray energy dispersive spectrometry (XEDS) in the latest aberration-corrected scanning transmission electron microscopes (STEMs) because more probe current can be added into the incident probe by aberration-correction. Especially for EELS analysis, sufficient amounts of core-loss signals can be generated within a short acquisition time by higher current probes, and hence atomic-resolution EELS mapping has already been applied. For XEDS analysis, spatial resolution reaches ~ 0.4 nm, which implies atomic-level analysis is feasible, in aberration- corrected STEM. However, atomic-level chemical analysis is even more challenging in the XEDS approach since detection of X-ray signals is more limited than that in EELS (~100 times difference). The limited signals can be improved by applying spectrum-imaging (which records a full spectrum at individual pixels) in combination with multivariate statistical analysis.

Advancing Nanotechnology - IAMDN New Microscopes


Rutgers new scanning transmission electron microscope and new helium ion microscope help researchers develop nanotechnology used to fight cancer, generate power, and create more powerful electronics. Watch the video to learn more.

Click here for additional Rutgers News.

Contact Us

NR03HamiltonGate 607 Taylor Road
Piscataway, NJ 08854

P   848-445-1388
Email Us