Dept Banner
Dept Banner
-
-
hybrid perovskite single crystals
rubrene OFETs

Electron Microscopy

Facility Type: Smaller or Individual Faculty Laboratory

 


 

We have a range of microscopy facilities at Rutgers, including tools for scanning and transmission electron microscopy, scanning tunneling and atomic force microscopy, confocal microscopy, as well as optical and other methods.
 

Contact Christina Pettola 848-445-1388 or This email address is being protected from spambots. You need JavaScript enabled to view it. for open timeslots or if you need assistance in scheduling the equipment.

 

 

 

Contact:  Philip Batson
Professor, IAMDN, Physics, MSE
136 Frelinghuysen Road, Piscataway, NJ 08854
Telephone: 848-445-8275

Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

Rutgers Institute for Advanced Materials, Devices and Nanotechnology (IAMDN) Scanning Transmission Electron Microscope (STEM) with meV resolution Electron Energy Loss Spectroscopy (EELS) can visualize the atomic structure of new materials, and explore composition, bonding, electronic and vibrational energy scales to enable better materials designs for efficient energy production and storage, catalysis, nanoelectronics and photonics.

 

 

nanoeq16

Contact: Frederic Cosandey
Professor, Materials Science and Engineering
607 Taylor Road, Piscataway, NJ 08854
Telephone: 848-445-4942 ,

Contact:  Philip Batson
Professor, IAMDN, Physics, MSE
136 Frelinghuysen Road, Piscataway, NJ 08854
Telephone: 848-445-5500 x8248/5-3861
Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

Field Emission TEM/STEM, (JEOL 2010F), Nanophysics Laboratory Room 107

  • Acceleration voltage 20-200kV with ZrO-W field emission source
  • Scanning Transmission Electron Microscopy (STEM) interface
  • Digital imaging with 1Kx1K CCD camera
  • BF/DF STEM detectors
  • HADF STEM detector
  • Electron Energy Loss (EELS) spectrometer
  • 2Kx2K GATAN imaging EELS filter (GIF)
  • Heating (1400K) and cooling (90K) holders
  • Electron biprism for holography imaging of magnetic and electrical fields

 

Click here to reserve the JEOL 2010F STEM Microscope. Please read the pdf IAMDN Microscopy Policies  and complete the pdf User Agreement Form .

   

nanoeq15

Contact: Frederic Cosandey
Professor, Materials Science and Engineering
607 Taylor Road, Piscataway, NJ 08854
Telephone: 848-445-4942

Transmission Electron Microscope (TEM) (Topcon 002B)

  • Acceleration voltage 20-200kV with Lab6 electron source
  • High resolution lattice imaging (HRTEM) and diffraction
  • Nano-probe diffraction and convergent beam electron diffraction (CBED) analysis
  • Chemical analysis and mapping with X-Ray energy dispersive spectroscopy (EDS)
  • Chemical analysis with electron energy loss spectroscopy (EELS)
  • Image simulation and diffraction analysis
   

Zeiss Sigma FESEM Oxford EDS-smaller

Contact: Sukanya Murali, Ph.D.
Ceramic, Composite and Optical Materials Center Rutgers University
607 Taylor Rd, Piscataway, NJ 08854
Tel:  (732) 445-4534
Email: This email address is being protected from spambots. You need JavaScript enabled to view it.

Zeiss Sigma Field Emission SEM with Oxford EDS

  • Acceleration voltages from 100V-30 kV, utilizing a ZrO-W Schottky field emission source
  • High resolution imaging with secondary and back scatter electrons: resolution up to 1.7nm at 15 kV and 3.0nm at 1 kV
  • It is ideally suited for the observation of non-conductive samples such as ceramics, glass, polymers and semi-conductors
  • Instrument has a fully automated stage and controls
  • Chemical analysis and mapping with x-ray energy dispersive spectroscopy (EDS) is provided by an Oxford INCA Energy 250 Microanalysis system
   

FESEM

Contact: Victor A. Greenhut, Professor, Materials Science and Engineering
607 Taylor Road, Room 102
Phone: 848-445-3870 or 848-445-5605
E-mail: This email address is being protected from spambots. You need JavaScript enabled to view it.

Field Emission Scanning Electron Microscope (FESEM) (ZEISS 982)

  • Acceleration voltage 500V-30kV with ZrO-W Field emission source
  • High resolution imaging with secondary and back-scatter electrons
  • Image analysis and size quantification
  • Chemical analysis and mapping with X-Ray energy dispersive spectroscopy (EDS)

Advancing Nanotechnology - IAMDN New Microscopes

 

Rutgers new scanning transmission electron microscope and new helium ion microscope help researchers develop nanotechnology used to fight cancer, generate power, and create more powerful electronics. Watch the video to learn more.

Click here for additional Rutgers News.

Contact Us

NR03HamiltonGate 607 Taylor Road
Piscataway, NJ 08854

P   848-445-1388
Email Us