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TEM/STEM Imaging and Electron Energy Loss Spectroscopy

Speaker: Frederic Cosandey, Materials Science and Engineering, Rutgers University
Date & Time: October 16, 2008 - 12:00pm
Location: Chem. 260


TEM/STEM Imaging and Electron Energy Loss Spectroscopy
Laboratory for Surface Modification


Frederic Cosandey, Materials Science and Engineering, Rutgers University
12:00 Noon, Chem. 260

We recently installed at Rutgers University, a state-of-the-art transmission electron microscope (TEM) with scanning transmission (STEM) and electron energy loss spectroscopy (EELS) capabilities. The acquisition of this TEM/STEM instrument offers new research opportunities for the entire Rutgers scientific community. In this presentation, the performance evaluation results of this instrument will be presented along with examples of its capabilities. In particular, STEM imaging combined with EELS allows studies of materials such as chemical analysis as well as bonding information at the atomic scale.

In the positive electrode of Li-Ion batteries, the Li ion and electron transfers occurring during charge and discharge processes are compensated by oxidation or reduction of the transition metal. Such processes can be followed by EELS with nanometer scale spatial resolution. Two examples of structural changes and charge transfer in the LiMn1.5Ni0.5O4 intercalated spinel and the total conversion systems, FeF3/C or FeF2/C nanocomposites, will be presented.

Followed by:
Open house of the TEM/STEM IAMDN Facility in the NPL Building at
1:00 – 2:00 with coffee/refreshments

Advancing Nanotechnology - IAMDN New Microscopes

 

Rutgers new scanning transmission electron microscope and new helium ion microscope help researchers develop nanotechnology used to fight cancer, generate power, and create more powerful electronics. Watch the video to learn more.

Click here for additional Rutgers News.

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