Microstructure and Texture analysis of Thin Films
Speaker:
Dr. Rao Karavadi, Lehigh University
Date & Time:
June 17, 2008 - 10:30am
Location:
CCR Room 201 | Microstructure and Texture analysis of Thin Films Institute for Advanced Materials and Devices |
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| Dr. Rao Karavadi, Lehigh University 10:30 AM, CCR Room 201 The microstructure and texture of Magnetic and Superconducting thin films prepared by Pulsed Laser Deposition (PLD) and to establish structure-property relations for these materials in order to improve their properties and design new structures. The main motivation for the use of TEM is that many applicable magnetic properties are of extrinsic rather than intrinsic nature. Hence, a detailed knowledge of both physical and magnetic microstructures is essential to understand the structure property relation in order to optimize the material properties. Many of the materials of interest are markedly inhomogeneous, with features requiring resolution on a sub-50 nm scale for a detailed investigation. Hence, the attraction of TEM is twofold. It offers very high spatial resolution and, because of the large number of interactions that take place when a beam of fast electrons hits a thin solid specimen, detailed insight into composition as well as crystallographic and magnetic structure. The resolution that is achievable largely depends on the information sought and may well be limited by the specimen itself. Typical resolutions achievable are 0.2-1.0 nm for structural analysis, 1-3 nm for extraction of composition information, and 2-20 nm for magnetic imaging. This work has been collaboration with Institute of Solid State and Materials Research (IFW) Dresden, Germany. Host: Frederic Cosandey |