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Please join us for the Twenty-Eighth Annual Symposium
Laboratory for Surface Modification


Friday, March 28, 2014
Rutgers University, Busch Campus, Fiber Optics Auditorium

The symposium will celebrate the construction of two world leading microscopy facilities at Rutgers:

• Nion Scanning Transmission Electron Microscope equipped for ultra-high energy resolution energy loss spectroscopy - The Scanning Transmission Electron Microscope (STEM) with meV resolution Electron Energy Loss Spectroscopy (EELS) can visualize the atomic structure of new materials, and explore composition, bonding, electronic and vibrational energy scales to enable better materials designs for efficient energy production and storage, catalysis, nanoelectronics and photonics.
• Zeiss Helium Ion Microscope for ultra-high spatial resolution ion scattering - The Helium Ion Microscope is a novel instrument for imaging surfaces with sub-nm resolution and unprecedented depth of view. Non-conducting samples can be probed without metallic coatings, and samples can be modified and new structures can be formed by ion irradiation. Potential applications include advances in fields from drug delivery and the creation of orifices to explore DNA sequencing to the formation of qantum structures for advanced computing and communications.
There will be opportunities to visit these facilities and to discuss future collaborations. The invited speakers are world renowned experts in these fields:
9:15AM   - Prof. John Silcox, Cornell University
10:30AM - Dr. Ondrej Krivanek FRS, President, Nion Corporation
1:30PM   - Dr. John Notte, Director R&D, Carl Zeiss Microscopy LLC
2:15PM   - Dr. J. Albert Schulz, President, Ionwerks Inc

Registration is free, however in order to participate, prior registration is requested. Breakfast and lunch will be provided for all attendees. Please Email Ms. Gwen Chupka to register at This email address is being protected from spambots. You need JavaScript enabled to view it..

Facilities tours will be given from:

11:45 AM - 1:30 PM for the Scanning Transmission Electron Microscope (STEM)

3:15 - 4:30 PM for the Helium Ion Microscope

Visitors may park in Lots 59, 60B & 60A without permits View Map

Poster session will be held from 11:45 AM - 1:30 PM presenting work on a wide range of topics concerned with experimental and theoretical studies of surfaces, interfaces and their applications, as well as nanoscale phenomena. The best student poster presentation(s) will be awarded the Theodore E. Madey Prize, which includes a $300 award and a certificate.

Final Program

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